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JRC - ISPRA
JOINT RESEARCH CENTRE IN ISPRA
Address
Via E. Fermi 2749- Ispra- Italy
https://ec.europa.eu/jrc/en/about/jrc-site/ispra
Access to JRC - ISPRA
The Site Offer
How to reach
JRC@NFFA-Europe
The Site Offer
Tools available @ laboratories
Electronic & Chemical & Magnetic Characterization
Chemical analysis
HPLC
HPLC with CAD, UV and Fluorescence detectors(Chemical composition analysis)
ICP-MS
ICP Mass spectroscopy (ICP-MS) (single particle analysis, trace element analysis)
Electron spectroscopy
XPS
X-ray Photoelectron Spectroscopy
Luminescence spectroscopy
FS
Fluorescence Spectroscopy
TR-XRF
Total Reflection X-ray Fluorescence Spectrometer (TR-XRF) (Trace element analysis)
Optical spectroscopy
FTIR
Fourier Transform Infra Red Spectroscopy and Spectromicroscopy
RS
Raman spectroscopy
Nano to Micro/Macro
2D/3D bio-printing
MS
Micro-spotter (protein spotting on surfaces)
Biomolecules and biomaterials analysis
CD
Circular dichroism (protein structure analysis)
DNAMS
DNA Microarray scanner (Absorbance Fluorescence Luminescence)
Elisa-PR
Elisa (enzyme-linked immunosorbent assay) plate reader / Multimode plate reader
QCMB
Quartz crystal microbalance biosensor(Biomolecular real-time detection)
RT PCR
Real time Polymerase chain reaction (RT PCR)
SPRB
Surface Plasmon Resonance Biosensor (Biomolecular real-time detection)
in vitro assays and cell analysis
FC
Flow cytometry (cell sorting)
INA
In Vitro Assays
MHCACC
Microscope for high content analysis of cell culture (high throughput cell analysis)
Structural & Morphology Characterization
Dispersed-phases characterisation
AFFF
Asymmetric Field Flow Fractionation with different detectors (MALS, DLS, UV-vis). Nanoparticle separation by sizes
DCS
Disk centrifuge sedimentation (nanoparticle sizing)
DLS
Dynamic Light Scattering
MALS
Multi Angle Light Scattering (MALS) (nanoparticle sizing)
UAC
Analytical Ultra Centrifuge (UAC) (nanoparticle/protein sizing)
Electron and ion beam technologies
SEM
Scanning Electron Microscopy
SIMS
Secondary Ion Mass Spectrometry
TEM
Transmission Electron Microscopy
Scanning probe microscopy
AFM
Atomic Force Microscopy
Surface/overlayer/interface characterisation
BET
BET instrument (determination of volume surface specific area of nanoparticle )
X-ray analysis
XRD
X-Ray Diffraction