Analysis of a wide range of materials, from micrometer powders to thin films and/or nano-engineered heterostructures

Cu Kα (1.5405 Å) Interchangeable fixed slits and one Soller slit

Cu Kα (1.5405 Å)

Sealed proportional counter Fixed slit plus programmable receiving slit Graphite analyser

Open Eulerian cradle: - incidence angle ± 92˚ - azimuth angle 2 x 360˚ - x,y in plane translation: 100 x 100 mm - z vertical translation minimum step 1 µm

X-ray diffraction (phase, stress, texture analysis) of thin films and multilayers materials X-ray reflectivity (thickness, electronic density, roughness) of thin films and mutilayers X-ray fluorescence (chemical analysis) Non ambient condition (heating up to 1100°C under different atmospheres)

X-ray microsource (50 to 150 micrometers spot size) 50 W with parallel and focusing primary optics (mirrors)

Copper source (8 keV)

2D detector (60x60 mm², curved detector (120° aperture / radius 250 mm), fluorescence detector and scintillator

Kα1-2 spectral lines 200 eV for fluorescence

Spot size at sample position (50 to 150 ums)

100 mm substrate size or small coupons

In situ (temperature) measurements up to 1100°C under primary vacuum or under air, nitrogen, argon, helium atmosphere (1 bar)

XRD – D8 Discover

X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA

Texture and microdiffraction measurements

X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA

Two-dimensional (2-D) detector –Vantec 500 (window of 140 mm diameter)

Centric Eulerian cradle

Powder, thin films or bulk samples

Diferent size collimators (0.1, 0.3 and 0.5mm)

Powder diffraction Out-of-plane and rocking curve measurements of thin films

X-ray Source: Cu anode long fine focus ceramic X-ray tube, running conditions for the X-Ray tube: 45 kV and 35 mA

Scintillation counter

Bragg-Brentano geometry

Powder, thin films or bulk samples (no more than 2cmx2cm)

The Material Science (MS) beamline serves two endstations for surface diffraction and powder diffraction

Short-period (14 mm) in-vacuum, cryogenically cooled, permanent magnet undulator, flux at 10eV: 2.5x1013 ph/s/0.4 A, focused spot size 130µm x 40µm (1:1 focusing)

5 - 38 keV

PILATUS II novel photon-counting 2-D pixel detector, 486 x 195 pixels, each pixel subtending 0.0086o x 0.0086o, high SNR due to its zero electronic background noise, excellent point spread function; 2+3-circle surface diffractometer from Micro-Controle Newport

Horizontal or vertical sample positioning, hexapod for sample positioning and aligning

UHV, cryo-chamber

Powder diffraction endstation is also available

Choice of filters

Single Crystal X-ray diffraction (SCXRD)

Mo-Kalpha and Cu-Kalpha Microfocus tube (50 kV, 1 mA)

8.0 keV (Cu) 17.5 keV (Mo)

Single Photon Detector Dectris Pilatus 300K

omega scan

4.5 - 36 keV

5.81 mm-1

single crystal (min size 50 µm) T 150 - 300 K

no

Crystalline structure, 2T/T, GIXRD, rocking curve and RSM scan

Cu K-alpha radiation, 1.6 kW, Goebel mirror and beam compressor

X-ray wavelength: 1.5406 Å

PathFinder point detector (variable slit and three bounce Ge(220) crystal)

Eulerian cradle, x, y, z, rotation and tilt of sample

Line focus, beam dimensions: roughly 10 x 0.2 mm

Solid sample, max 4" wafer or smaller pieces, max thickness is 1 mm

Ambient

No

MPD (Materials Powder Diffractometer) is suitable for the analysis of polycrystalline samples at room temperature. This diffractometer has a vertical theta-theta goniometer (240 mm radius), where the sample stage is fixed and does not rotate around omega axis as in omega-2theta diffractometers. Two different configurations are available: Bragg-Brentano and Transmission configuration. Applications: Identification of crystalline phases in organic and inorganic compounds, Quantitative phase analysis in organic and inorganic compounds, Particle size determination.

X-ray source: Cu Κα radiation (Κα = 1.54187 Å)

The detector used is an X’Celerator which is an ultra-fast X-ray detector based on Real Time Multiple Strip (RTMS) technology

Polycrystalline samples at room temperature (Powder, bulk, liquid)

Air and Room temperature experiments

Available capillary measurements for air-sensitive samples, liquids, or small quantities of powder.

The MRD (Materials Research Diffractometer) is suitable for the structural characterization in thin-films materials at room and high temperature. This diffractometer has a horizontal ω-2θ goniometer (320 mm radius) in a four-circle geometry and it works with a ceramic X-ray tube with Κα anode (λ=1.540 Å). This diffractometer is equipped with different incident and diffracted optics which can be interchanged depending on the application required (i.e. a parabolic mirror, a hybrid monochromator, a Ge(440) four-crystal monochromator, a parallel plate collimator, and a polycapillary lens). Applications: 1) Crystal structure analysis: phase identification, determination of cell parameters, domain orientation and stress on thin films. 2) θ-2θ measurements (normal and high resolution) in epitaxial and polycrystalline thin-films. 3) X-ray Reflectivity measurements for estimation of thickness and roughness. 4) Rocking curves measurements. 5) Reciprocal Space Mappings. 6) Texture analysis (Phi and pole figures measurements) 7) Grazing incidence measurements.

X-ray source: Cu Κα radiation (Κα = 1.54187 Å)

PIXCel detector (2D solid state detector 256x256 pixels works as 1D detector). Ideal for fast reciprocal space mapping.

From a few mm2 up to 3” diameter flat samples.

na

no

na

no

na

0

X-ray diffraction analysis (XRD) is a technique used to determine the crystallographic structure of a material. Different holders can accommodate samples both in powder and thin film form.

Electronic and photonic device, photovoltaic, sensor application, crystal growth study, and crystal optics for synchrotron, FELs or accelerators

Synchrotron beam with a Si(111) monochromator

5 to 60 keV

Fields of view from 1.2 mm to 11 mm in size, for pixel size varying from 0.6 to 5 μm.

10 µm. More accurate and quantitative analysis by Rocking Curve Imaging measurement for a chosen family of planes

All crystals (mostly single crystals). Solid samples from millimetre to several decimetres.

no

Beamline BM05 @ESRF

no

na

1000

non-destructive characterisation of local electrical properties of semiconductor-based detectors. Impact of local defects on the current through the semiconductor

Synchrotron beam with a Si(111) monochromator

5 to 60 keV

Picoamperemeter for the XBIC technique and preamplifier/oscilloscope for the ToF-XBIC technique

Mapping of samples up to square centimeters are possible

Mapping resolution down to 10 um2

Solid semiconductors up to decimetre size

A pin diode is placed behind the sample in order to determine with accuracy the photon flux on the sample, and the theorical current value to compute the gap with the measured current.

no

Beamline BM05 @ ESRF

no

na

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