X-Ray Diffraction

Structural & Morphology Characterization (X-ray analysis)

Due to the upcoming SLS 2.0 upgrade this technique will be unavailable at PSI until further notice.

XRD for a range of different applications continues to be available at the sites listed below.

XRD provides non-destructive information on the structural order of a material.

When the X-ray wavelength is of the order of the crystal lattice spacing, at large scattering angles, XRD permits the identification of different crystal phases in a sample and the quantification of lattice distances and crystalline volume fractions.

At low angles of incidence, the X-rays are reflected at the surface or interface, and from the resulting X-ray reflectometry data the surface roughness of a single crystal and the thickness of a deposition layer can be obtained.

At an angle of incidence below the critical angle XRD is highly surface sensitive.

NEW from October 2022: A compound refractive lens (CRL) nanofocusing system with integrated aberration correction has been developed in the NFFA project and is now available to users at the beamline P06 of PETRA III at DESY. The aberrations are compensated by a tailor-made optical phase plate. It can provide sub-micrometer x-ray beams up to 35 keV for scanning micro-XRD applications.

provided at NFFA-Europe laboratories by:

provided at Large Scale Facilities by:

CNR-IOM @TS

Italy

Four-circle X-ray diffractometer PanalyticalX'pert

Applications

Analysis of a wide range of materials, from micrometer powders to thin films and/or nano-engineered heterostructures

Source

Cu Kα (1.5405 Å) Interchangeable fixed slits and one Soller slit

Source Energy Range

Cu Kα (1.5405 Å)

Detection

Sealed proportional counter Fixed slit plus programmable receiving slit Graphite analyser

Scanning/Positioning

Open Eulerian cradle: - incidence angle ± 92˚ - azimuth angle 2 x 360˚ - x,y in plane translation: 100 x 100 mm - z vertical translation minimum step 1 µm

CEA/LETI

France

Hibrix

Applications

X-ray diffraction (phase, stress, texture analysis) of thin films and multilayers materials X-ray reflectivity (thickness, electronic density, roughness) of thin films and mutilayers X-ray fluorescence (chemical analysis) Non ambient condition (heating up to 1100°C under different atmospheres)

Source

X-ray microsource (50 to 150 micrometers spot size) 50 W with parallel and focusing primary optics (mirrors)

Source Energy Range

Copper source (8 keV)

Detection

2D detector (60x60 mm², curved detector (120° aperture / radius 250 mm), fluorescence detector and scintillator

Detection Energy Range

Kα1-2 spectral lines 200 eV for fluorescence

Overall Spatial Resolution

Spot size at sample position (50 to 150 ums)

Sample

100 mm substrate size or small coupons

Environment

In situ (temperature) measurements up to 1100°C under primary vacuum or under air, nitrogen, argon, helium atmosphere (1 bar)

CSIC-ICMAB

Spain

XRD – D8 Discover

Applications

XRD – D8 Discover

Source

X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA

CSIC-ICMAB

Spain

XRD – D8 Advance

Applications

Texture and microdiffraction measurements

Source

X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA

Detection

Two-dimensional (2-D) detector –Vantec 500 (window of 140 mm diameter)

Scanning/Positioning

Centric Eulerian cradle

Sample

Powder, thin films or bulk samples

Additional Tools

Diferent size collimators (0.1, 0.3 and 0.5mm)

CSIC-ICMAB

Spain

XRD – Siemens D5000

Applications

Powder diffraction Out-of-plane and rocking curve measurements of thin films

Source

X-ray Source: Cu anode long fine focus ceramic X-ray tube, running conditions for the X-Ray tube: 45 kV and 35 mA

Detection

Scintillation counter

Scanning/Positioning

Bragg-Brentano geometry

Sample

Powder, thin films or bulk samples (no more than 2cmx2cm)

PSI

Switzerland

XRD - MS Beamline @ Swiss Light Source Synchrotron

Applications

The Material Science (MS) beamline serves two endstations for surface diffraction and powder diffraction

Source

Short-period (14 mm) in-vacuum, cryogenically cooled, permanent magnet undulator, flux at 10eV: 2.5x1013 ph/s/0.4 A, focused spot size 130µm x 40µm (1:1 focusing)

Source Energy Range

5 - 38 keV

Detection

PILATUS II novel photon-counting 2-D pixel detector, 486 x 195 pixels, each pixel subtending 0.0086o x 0.0086o, high SNR due to its zero electronic background noise, excellent point spread function; 2+3-circle surface diffractometer from Micro-Controle Newport

Scanning/Positioning

Horizontal or vertical sample positioning, hexapod for sample positioning and aligning

Environment

UHV, cryo-chamber

Additional Tools

Powder diffraction endstation is also available

Ancillary Techniques

Choice of filters

KIT

Germany

STOE STADI Vari

Applications

Single Crystal X-ray diffraction (SCXRD)

Source

Mo-Kalpha and Cu-Kalpha Microfocus tube (50 kV, 1 mA)

Source Energy Range

8.0 keV (Cu) 17.5 keV (Mo)

Detection

Single Photon Detector Dectris Pilatus 300K

Scanning/Positioning

omega scan

Detection Energy Range

4.5 - 36 keV

Overall Spatial Resolution

5.81 mm-1

Sample

single crystal (min size 50 µm) T 150 - 300 K

Remote Control

LUND + MAX IV

Sweden

XRD - Bruker D8 Discover

Applications

Crystalline structure, 2T/T, GIXRD, rocking curve and RSM scan

Source

Cu K-alpha radiation, 1.6 kW, Goebel mirror and beam compressor

Source Energy Range

X-ray wavelength: 1.5406 Å

Detection

PathFinder point detector (variable slit and three bounce Ge(220) crystal)

Scanning/Positioning

Eulerian cradle, x, y, z, rotation and tilt of sample

Overall Spatial Resolution

Line focus, beam dimensions: roughly 10 x 0.2 mm

Sample

Solid sample, max 4" wafer or smaller pieces, max thickness is 1 mm

Environment

Ambient

Remote Control

ICN2

Spain

Malvern PANalytical X’pert Pro MPD (Material Powder Diffractometer)

Applications

MPD (Materials Powder Diffractometer) is suitable for the analysis of polycrystalline samples at room temperature. This diffractometer has a vertical theta-theta goniometer (240 mm radius), where the sample stage is fixed and does not rotate around omega axis as in omega-2theta diffractometers. Two different configurations are available: Bragg-Brentano and Transmission configuration. Applications: Identification of crystalline phases in organic and inorganic compounds, Quantitative phase analysis in organic and inorganic compounds, Particle size determination.

Source

X-ray source: Cu Κα radiation (Κα = 1.54187 Å)

Detection

The detector used is an X’Celerator which is an ultra-fast X-ray detector based on Real Time Multiple Strip (RTMS) technology

Sample

Polycrystalline samples at room temperature (Powder, bulk, liquid)

Environment

Air and Room temperature experiments

Ancillary Techniques

Available capillary measurements for air-sensitive samples, liquids, or small quantities of powder.

ICN2

Spain

Malvern PANalytical X’pert Pro MRD (Material Research Diffractometer)

Applications

The MRD (Materials Research Diffractometer) is suitable for the structural characterization in thin-films materials at room and high temperature. This diffractometer has a horizontal ω-2θ goniometer (320 mm radius) in a four-circle geometry and it works with a ceramic X-ray tube with Κα anode (λ=1.540 Å). This diffractometer is equipped with different incident and diffracted optics which can be interchanged depending on the application required (i.e. a parabolic mirror, a hybrid monochromator, a Ge(440) four-crystal monochromator, a parallel plate collimator, and a polycapillary lens). Applications: 1) Crystal structure analysis: phase identification, determination of cell parameters, domain orientation and stress on thin films. 2) θ-2θ measurements (normal and high resolution) in epitaxial and polycrystalline thin-films. 3) X-ray Reflectivity measurements for estimation of thickness and roughness. 4) Rocking curves measurements. 5) Reciprocal Space Mappings. 6) Texture analysis (Phi and pole figures measurements) 7) Grazing incidence measurements.

Source

X-ray source: Cu Κα radiation (Κα = 1.54187 Å)

Detection

PIXCel detector (2D solid state detector 256x256 pixels works as 1D detector). Ideal for fast reciprocal space mapping.

Sample

From a few mm2 up to 3” diameter flat samples.

EURONANOLAB

France

XRD at EURONANOLAB - CEITEC

EURONANOLAB

France

XRD at EURONANOLAB - MMI

Applications

Remote Control

Manufacturer and model

Interactive Remote Access

Raw data open file format(s)

Average amount of data produced in 8 hours (M B)

EURONANOLAB

France

XRD at EURONANOLAB - IMT

EURONANOLAB

France

XRD at EURONANOLAB - FEMTO-ST

EURONANOLAB

France

XRD at EURONANOLAB - IMM

EURONANOLAB

France

XRD at EURONANOLAB - PoliFAB

EURONANOLAB

France

XRD at EURONANOLAB - LAAS

EURONANOLAB

France

XRD at EURONANOLAB - Nanotec

JRC - ISPRA

Italy

X-ray diffraction

Applications

X-ray diffraction analysis (XRD) is a technique used to determine the crystallographic structure of a material. Different holders can accommodate samples both in powder and thin film form.

CNR-DSCTM

Italy

XRD at CNR-IPCB

ESRF

France

XRD imaging @ ESRF

Applications

Electronic and photonic device, photovoltaic, sensor application, crystal growth study, and crystal optics for synchrotron, FELs or accelerators

Source

Synchrotron beam with a Si(111) monochromator

Source Energy Range

5 to 60 keV

Scanning/Positioning

Fields of view from 1.2 mm to 11 mm in size, for pixel size varying from 0.6 to 5 μm.

Overall Spatial Resolution

10 µm. More accurate and quantitative analysis by Rocking Curve Imaging measurement for a chosen family of planes

Sample

All crystals (mostly single crystals). Solid samples from millimetre to several decimetres.

Remote Control

Manufacturer and model

Beamline BM05 @ESRF

Interactive Remote Access

Raw data open file format(s)

Average amount of data produced in 8 hours (M B)

1000

ESRF

France

XBIC and ToF-XBIC @ ESRF

Applications

non-destructive characterisation of local electrical properties of semiconductor-based detectors. Impact of local defects on the current through the semiconductor

Source

Synchrotron beam with a Si(111) monochromator

Source Energy Range

5 to 60 keV

Detection

Picoamperemeter for the XBIC technique and preamplifier/oscilloscope for the ToF-XBIC technique

Scanning/Positioning

Mapping of samples up to square centimeters are possible

Overall Spatial Resolution

Mapping resolution down to 10 um2

Sample

Solid semiconductors up to decimetre size

Additional Tools

A pin diode is placed behind the sample in order to determine with accuracy the photon flux on the sample, and the theorical current value to compute the gap with the measured current.

Remote Control

Manufacturer and model

Beamline BM05 @ ESRF

Interactive Remote Access

Raw data open file format(s)

Average amount of data produced in 8 hours (M B)

996

CNR-DSCTM

Italy

XRD @ Bologna

Applications

Manufacturer and model

Interactive Remote Access

Raw data open file format(s)

csv

Average amount of data produced in 8 hours (M B)

Id	Name	Institution	Applications	Source	Source Energy Range	Detection	Scanning/Positioning	Detection Energy Range	Overall Spatial Resolution	Sample	Environment	Additional Tools	Ancillary Techniques	Remote Control	Manufacturer and model	Interactive Remote Access	Raw data open file format(s)	Average amount of data produced in 8 hours (MB)
62330c11ff8d760b95422b6c	Four-circle X-ray diffractometer PanalyticalX'pert	CNR-Istituto Officina Dei Materiali (Trieste)	Analysis of a wide range of materials, from micrometer powders to thin films and/or nano-engineered heterostructures	Cu Kα (1.5405 Å) Interchangeable fixed slits and one Soller slit	Cu Kα (1.5405 Å)	Sealed proportional counter Fixed slit plus programmable receiving slit Graphite analyser	Open Eulerian cradle: - incidence angle ± 92˚ - azimuth angle 2 x 360˚ - x,y in plane translation: 100 x 100 mm - z vertical translation minimum step 1 µm
62332017ff8d760b95422ccc	Hibrix	Laboratoire d'électronique des technologies de l'information	X-ray diffraction (phase, stress, texture analysis) of thin films and multilayers materials X-ray reflectivity (thickness, electronic density, roughness) of thin films and mutilayers X-ray fluorescence (chemical analysis) Non ambient condition (heating up to 1100°C under different atmospheres)	X-ray microsource (50 to 150 micrometers spot size) 50 W with parallel and focusing primary optics (mirrors)	Copper source (8 keV)	2D detector (60x60 mm², curved detector (120° aperture / radius 250 mm), fluorescence detector and scintillator		Kα1-2 spectral lines 200 eV for fluorescence	Spot size at sample position (50 to 150 ums)	100 mm substrate size or small coupons	In situ (temperature) measurements up to 1100°C under primary vacuum or under air, nitrogen, argon, helium atmosphere (1 bar)
62335bb1fe8f7ffef201b00e	XRD – D8 Discover	Institut de Ciència de Materials de Barcelona	XRD – D8 Discover	X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA
62335bddfe8f7ffef201b143	XRD – D8 Advance	Institut de Ciència de Materials de Barcelona	Texture and microdiffraction measurements	X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA		Two-dimensional (2-D) detector –Vantec 500 (window of 140 mm diameter)	Centric Eulerian cradle			Powder, thin films or bulk samples		Diferent size collimators (0.1, 0.3 and 0.5mm)
62335c08fe8f7ffef201b144	XRD – Siemens D5000	Institut de Ciència de Materials de Barcelona	Powder diffraction Out-of-plane and rocking curve measurements of thin films	X-ray Source: Cu anode long fine focus ceramic X-ray tube, running conditions for the X-Ray tube: 45 kV and 35 mA		Scintillation counter	Bragg-Brentano geometry			Powder, thin films or bulk samples (no more than 2cmx2cm)
6234723afe8f7ffef201bf94	XRD - MS Beamline @ Swiss Light Source Synchrotron	PAUL SCHERRER INSTITUT	The Material Science (MS) beamline serves two endstations for surface diffraction and powder diffraction	Short-period (14 mm) in-vacuum, cryogenically cooled, permanent magnet undulator, flux at 10eV: 2.5x1013 ph/s/0.4 A, focused spot size 130µm x 40µm (1:1 focusing)	5 - 38 keV	PILATUS II novel photon-counting 2-D pixel detector, 486 x 195 pixels, each pixel subtending 0.0086o x 0.0086o, high SNR due to its zero electronic background noise, excellent point spread function; 2+3-circle surface diffractometer from Micro-Controle Newport	Horizontal or vertical sample positioning, hexapod for sample positioning and aligning				UHV, cryo-chamber	Powder diffraction endstation is also available	Choice of filters
6267ad85092ba1e575e45a22	STOE STADI Vari	KARLSRUHE INSTITUTE OF TECHNOLOGY	Single Crystal X-ray diffraction (SCXRD)	Mo-Kalpha and Cu-Kalpha Microfocus tube (50 kV, 1 mA)	8.0 keV (Cu) 17.5 keV (Mo)	Single Photon Detector Dectris Pilatus 300K	omega scan	4.5 - 36 keV	5.81 mm-1	single crystal (min size 50 µm) T 150 - 300 K				no
62ce68105afe3685fe28de34	XRD - Bruker D8 Discover	LUNDS UNIVERSITET + MAX IV	Crystalline structure, 2T/T, GIXRD, rocking curve and RSM scan	Cu K-alpha radiation, 1.6 kW, Goebel mirror and beam compressor	X-ray wavelength: 1.5406 Å	PathFinder point detector (variable slit and three bounce Ge(220) crystal)	Eulerian cradle, x, y, z, rotation and tilt of sample		Line focus, beam dimensions: roughly 10 x 0.2 mm	Solid sample, max 4" wafer or smaller pieces, max thickness is 1 mm	Ambient			No
62d7d548f684fb9143b149d6	Malvern PANalytical X’pert Pro MPD (Material Powder Diffractometer)	CATALAN INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY	MPD (Materials Powder Diffractometer) is suitable for the analysis of polycrystalline samples at room temperature. This diffractometer has a vertical theta-theta goniometer (240 mm radius), where the sample stage is fixed and does not rotate around omega axis as in omega-2theta diffractometers. Two different configurations are available: Bragg-Brentano and Transmission configuration. Applications: Identification of crystalline phases in organic and inorganic compounds, Quantitative phase analysis in organic and inorganic compounds, Particle size determination.	X-ray source: Cu Κα radiation (Κα = 1.54187 Å)		The detector used is an X’Celerator which is an ultra-fast X-ray detector based on Real Time Multiple Strip (RTMS) technology				Polycrystalline samples at room temperature (Powder, bulk, liquid)	Air and Room temperature experiments		Available capillary measurements for air-sensitive samples, liquids, or small quantities of powder.
62d93243f684fb9143b15488	Malvern PANalytical X’pert Pro MRD (Material Research Diffractometer)	CATALAN INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY	The MRD (Materials Research Diffractometer) is suitable for the structural characterization in thin-films materials at room and high temperature. This diffractometer has a horizontal ω-2θ goniometer (320 mm radius) in a four-circle geometry and it works with a ceramic X-ray tube with Κα anode (λ=1.540 Å). This diffractometer is equipped with different incident and diffracted optics which can be interchanged depending on the application required (i.e. a parabolic mirror, a hybrid monochromator, a Ge(440) four-crystal monochromator, a parallel plate collimator, and a polycapillary lens). Applications: 1) Crystal structure analysis: phase identification, determination of cell parameters, domain orientation and stress on thin films. 2) θ-2θ measurements (normal and high resolution) in epitaxial and polycrystalline thin-films. 3) X-ray Reflectivity measurements for estimation of thickness and roughness. 4) Rocking curves measurements. 5) Reciprocal Space Mappings. 6) Texture analysis (Phi and pole figures measurements) 7) Grazing incidence measurements.	X-ray source: Cu Κα radiation (Κα = 1.54187 Å)		PIXCel detector (2D solid state detector 256x256 pixels works as 1D detector). Ideal for fast reciprocal space mapping.				From a few mm2 up to 3” diameter flat samples.
632c72baade32b703c95b751	XRD at EURONANOLAB - CEITEC	EURONANOLAB
632c72cfade32b703c95b758	XRD at EURONANOLAB - MMI	EURONANOLAB	na											no	na	no	na	0
632c72e0ade32b703c95b75f	XRD at EURONANOLAB - IMT	EURONANOLAB
633446d4142b3a3ca16df28f	XRD at EURONANOLAB - FEMTO-ST	EURONANOLAB
6335b39e142b3a3ca16e0eb2	XRD at EURONANOLAB - IMM	EURONANOLAB
639625fb2c820c0cf7d8e5b0	XRD at EURONANOLAB - PoliFAB	EURONANOLAB
639645162c820c0cf7d8e5cf	XRD at EURONANOLAB - LAAS	EURONANOLAB
639645612c820c0cf7d8e5d1	XRD at EURONANOLAB - Nanotec	EURONANOLAB
63a191a8250bc7e3ec38657d	X-ray diffraction	JOINT RESEARCH CENTRE IN ISPRA	X-ray diffraction analysis (XRD) is a technique used to determine the crystallographic structure of a material. Different holders can accommodate samples both in powder and thin film form.
6520101b9ded42bca9b0267e	XRD at CNR-IPCB	CNR-Dipartimento di Scienze Chimiche e Tecnologia dei Materiali
66a9eef3d465fac613b6929d	XRD imaging @ ESRF	EUROPEAN SYNCHROTRON RADIATION FACILITY	Electronic and photonic device, photovoltaic, sensor application, crystal growth study, and crystal optics for synchrotron, FELs or accelerators	Synchrotron beam with a Si(111) monochromator	5 to 60 keV		Fields of view from 1.2 mm to 11 mm in size, for pixel size varying from 0.6 to 5 μm.		10 µm. More accurate and quantitative analysis by Rocking Curve Imaging measurement for a chosen family of planes	All crystals (mostly single crystals). Solid samples from millimetre to several decimetres.				no	Beamline BM05 @ESRF	no	na	1000
66a9f161d465fac613b6929e	XBIC and ToF-XBIC @ ESRF	EUROPEAN SYNCHROTRON RADIATION FACILITY	non-destructive characterisation of local electrical properties of semiconductor-based detectors. Impact of local defects on the current through the semiconductor	Synchrotron beam with a Si(111) monochromator	5 to 60 keV	Picoamperemeter for the XBIC technique and preamplifier/oscilloscope for the ToF-XBIC technique	Mapping of samples up to square centimeters are possible		Mapping resolution down to 10 um2	Solid semiconductors up to decimetre size		A pin diode is placed behind the sample in order to determine with accuracy the photon flux on the sample, and the theorical current value to compute the gap with the measured current.		no	Beamline BM05 @ ESRF	no	na	996
6757f81f4ded9c1dc3eaf493	XRD @ Bologna	CNR-Dipartimento di Scienze Chimiche e Tecnologia dei Materiali	-												-	no	csv	1