Due to the upcoming SLS 2.0 upgrade this technique will be unavailable at PSI until further notice.
XRD provides non-destructive information on the structural order of a material.
When the X-ray wavelength is of the order of the crystal lattice spacing, at large scattering angles XRD permits to identify different crystal phases in a sample and to quantify lattice distances and crystalline volume fractions.
At low angles of incidence, the X-rays are reflected at the surface or interface, and from the resulting X-ray reflectometry data the surface roughness of a single crystal and the thickness of a deposition layer can be obtained.
At an angle of incidence below the critical angle XRD is highly surface sensitive.