X-Ray Diffraction

X-ray analysis (Structural & Morphology Characterization)

XRD provides non-destructive information on the structural order of a material.

When the X-ray wavelength is of the order of the crystal lattice spacing, at large scattering angles XRD permits to identify different crystal phases in a sample and to quantify lattice distances and crystalline volume fractions.

At low angles of incidence, the X-rays are reflected at the surface or interface, and from the resulting X-ray reflectometry data the surface roughness of a single crystal and the thickness of a deposition layer can be obtained.

At an angle of incidence below the critical angle XRD is highly surface sensitive.

              

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          provided at NFFA-Europe laboratories by:
CNR-IOM (TS)
Italy
CNR-DSCTM
Italy
CSIC-ICMAB
Spain
ICN2
Spain
FORTH
Greece
C2N-CNRS
France
CEA/LETI
France
JRC - ISPRA
Italy
KIT
Germany
INESC-MN
Portugal
EuroNanoLab
Europe
LUND + MAX IV
Sweden
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          provided at Large Scale Facilities by:
ALBA
Spain
SOLEIL
France
PSI
Switzerland