Due to the upcoming SLS 2.0 upgrade this technique will be unavailable at PSI until further notice.

XRD for a range of different applications continues to be available at the sites listed below.

XRD provides non-destructive information on the structural order of a material.

When the X-ray wavelength is of the order of the crystal lattice spacing, at large scattering angles, XRD permits the identification of different crystal phases in a sample and the quantification of lattice distances and crystalline volume fractions.

At low angles of incidence, the X-rays are reflected at the surface or interface, and from the resulting X-ray reflectometry data the surface roughness of a single crystal and the thickness of a deposition layer can be obtained.

At an angle of incidence below the critical angle XRD is highly surface sensitive.

NEW from October 2022: A compound refractive lens (CRL) nanofocusing system with integrated aberration correction has been developed in the NFFA project and is now available to users at the beamline P06 of PETRA III at DESY. The aberrations are compensated by a tailor-made optical phase plate. It can provide sub-micrometer x-ray beams up to 35 keV for scanning micro-XRD applications.