This technology couples the use of an ICP with MS for elemental analysis by generation of ions. It can also detect different isotopes of the same element. In a typical analysis, samples consisting of dissolved elements are converted into a fine aerosol by pneumatic action of a flow of argon gas which smashes the liquid into tiny droplets. The droplets thus formed are conveyed in a continuous way into a spray chamber, which allows the smaller droplets (<10 µm) to enter the source of ionisation (the inductively coupled plasma). An inductively coupled plasma is a plasma that is energized (ionized) by inductively heating the gas with an electromagnetic coil, and contains a sufficient concentration of ions and electrons to make the gas electrically conductive. Once in the plasma, the aerosolized sample is dried, its molecules are dissociated and finally ionized by removal of an electron. The singly-charged ions thus formed are conveyed through a series of cones into a mass spectrometer, usually a quadrupole, which rapidly scans the mass range. At any given time, only one mass-to-charge ratio will be allowed to pass through the mass spectrometer from the entrance to the exit. Finally, detector receives an ion signal proportional to the concentration of the analyte in the sample. Quantification is made possible through a calibration curve of the reference material (e.g. pure element). A special application of ICP-MS (single particle ICP-MS) allows measuring size and number concentration of a particles suspension. Suspensions introduced to the plasma must have such a concentration as to allow one particle at the time to enter the plasma. As the droplets are desolvated, the resulting particles are ionized producing a burst of ions (one ion cloud per particle). The ions then pass into the quadrupole generating individual high intensity pulses. Each pulse originate from a particle and, assuming a spherical geometry, its intensity is proportional to the diameter.
In TEM/Scanning TEM (STEM) high energy electrons incident on ultra-thin samples, allow imaging, diffraction, electron energy loss spectroscopy and chemical analysis of solid materials with a spatial resolution on the order of 1-2 Å. Samples must have a thickness of a few tens of nanometres and are prepared in sample preparation laboratory.
XPS is a surface spectroscopic technique for quantitative measurements of the elemental composition or stoichiometry and the chemical state of the present elements, like their oxidation state and chemical bonds. XPS is highly surface sensitive, giving chemical and binding energy information from the a narrow region close to the surface.
Raman spectroscopy (RS) investigates the vibrational properties of a sample and provides chemical as well as structural information. RS does not require any specific sample preparation, size or condition and may be combined with micron/nano spatial resolution when operated using a confocal microscope/TERS or SNOM configuration.
XAS is sensitive to the local bonding environment of the atom absorbing the X-rays, providing information on oxidation states, local orbital symmetry, molecular orientation and chemically selective density of states. It is widely used in molecular and condensed matter physics, material science, engineering, chemistry, earth science and biology.
This technique has the mission of enabling researchers to visualise and to monitor cellular events in real time and in vivo down to the molecular level, enabling prolonged observations that are not possible with classic confocal microscopes and allowing unparalleled detail in soft matter imaging.