X-ray Photoelectron Spectroscopy

Electron spectroscopy (Electronic & Chemical & Magnetic Characterization)

XPS is a surface spectroscopic technique for quantitative measurements of the elemental composition or stoichiometry and the chemical state of the present elements, like their oxidation state and chemical bonds. Due to the limited free path-length of the excited photoelectrons within the material, XPS is highly surface sensitive, giving chemical and binding energy information from the narrow region close to the surface.

Angular resolved (AR) XPS permits to obtain a depth profile of the elemental composition and chemical state in this narrow surface region, and permits to determine the relative concentrations of surface elements versus buried ones, as, e.g., between head and tail groups of adsorbed alkanes. In combination with sputtering, a larger depth profile is possible. The X-ray spot-size on the sample surface is typically in the range of 5-100 µm.

 

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          provided at NFFA-Europe laboratories by:
CNR-IOM (TS)
Italy
CNR-DSCTM
Italy
PSI
Switzerland
CSIC-ICMM
Spain
ICN2
Spain
CEA/LETI
France
JRC - ISPRA
Italy
INL
Portugal
Uni-Namur
Belgium
EuroNanoLab
Europe
UMIL
Italy
Uni-NG
Slovenia
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          provided at Large Scale Facilities by:
CNR-IOM (TS)
Italy
PSI
Switzerland
ALBA
Spain
SOLEIL
France
KIT
Germany