Also consider
Theory & Simulation
SGSEP Structural and ground-state electronic properties
This technique offers the possibility of simulating structural and electronic properties based on the electronic ground state, including electronic charge analysis, energetics of formation, structural and vibrational properties; IR, Raman, EPR, NMR, core-level XAS & XPS, STM & AFM.
Theory & Simulation
TP Transport properties
This technique offers the possibility of modeling electronic quantum charge transport (Green’s function Landauer formalism), spin-dependent conductivities for spintronics applications, as well as thermal transport (Seebeck coefficients, semiclassical Boltzmann transport equation, ...).
Electronic & Chemical & Magnetic Characterization
XPS X-ray Photoelectron Spectroscopy
XPS is a surface spectroscopic technique for quantitative measurements of the elemental composition or stoichiometry and the chemical state of the present elements, like their oxidation state and chemical bonds. XPS is highly surface sensitive, giving chemical and binding energy information from the a narrow region close to the surface.
Structural & Morphology Characterization
XRD X-Ray Diffraction
XRD provides non-destructive information on the structural order of a material. At large scattering angles XRD permits to identify different crystal phases and to quantify lattice distances and crystalline volume fractions. At low angles of incidence the surface roughness of a single crystal and the thickness of a deposition layer can be obtained.
Structural & Morphology Characterization
TEM Transmission Electron Microscopy
In TEM/Scanning TEM (STEM) high energy electrons incident on ultra-thin samples, allow imaging, diffraction, electron energy loss spectroscopy and chemical analysis of solid materials with a spatial resolution on the order of 1-2 Å. Samples must have a thickness of a few tens of nanometres and are prepared in sample preparation laboratory.