SQUID technique is extremely powerful to measure the moment versus applied magnetic field (e.g. hysteresis loops) or moment versus temperature curves of magnetic nanomaterials in a broad temperature range. Its sensitivity is very high, therefore a small amount of material is enough to ensure reliable signals. In addition to hysteresis loops, SQUID measurements also allow precise determination of the Curie, Néel or blocking temperatures of ferromagnetic, antiferromagnetic or superparamagnetic nanoparticles.
SQUID Magnetometry with DC & AC options, 7 Tesla maximum field and ultra low field capability is offered to explore static and dynamic magnetic properties of various samples including nanoparticles, thin films, bulk materials, even samples in liquid media at extended areas of temperatures (Low-T: 1.9 - 400 K) and (High-T: 300 - 800 K). SQUID is a state-of-art facility that probes the cooperative magnetism and evaluates the relative interactions.
Superconducting Quantum Interference Device (SQUID) magnetometry provides invaluable insight into the physicochemical response of quantum materials by measuring accurately the magnetic moment as a function of applied magnetic field (e.g., magnetic hysteresis loops) and all the way down to ultra-cold temperatures. These measurements enable detailed characterization of magnetic, superconducting, magnetoelectric, and other correlated electronic states over a broad temperature range. The technique enables precise determination of key superconducting properties, including the critical temperature, Meissner effect, critical fields, and critical current density. It also provides quantitative characterization of magnetic phase transitions, such as the Curie, Néel, blocking, and spin-freezing temperatures, thereby revealing the behavior of ferro-, ferri-, antiferromagnetic, superparamagnetic, and spin-glass systems. These capabilities are essential for applications ranging from magnetic recording and spintronic devices to biomedical technologies, including MRI-guided therapeutics.
The SQUID magnetometer measures the total AC or DC magnetic moment (average sensitivity down to 10^-4 emu) of a sample as a function of temperature, magnetic field, time. The sample is moved through a set or pick-up coils (in second derivative geometry) in a continuous (DC) or oscillatory (RSO; the improved relative sensitivity enables a detection limit of 10^-8 emu) motion. Sample holders can accommodate diverse materials states, including liquid solutions and solid-state forms, specifically, polycrystalline pellets or powders (weighing approximately ~10 mg), as well as single crystals and thin films. Typically, standard gelatin or polycarbonate capsules are used, featuring an O.D. of ~5 mm, a height of ~15 mm.
The system offers a maximum field up to 7 Tesla and ultra-low field (<0.05 Gauss) capability to explore the static (DC) and dynamic (AC) magnetic properties of samples in various forms, including nanoparticles, thin films, bulk single crystals, and even samples in liquid media (e.g., ferrofluids), over extended areas of temperature (Low-T: 1.9 - 400 K and High-T: 300 - 800 K) and a dynamic range (f= 0.01 – 1000 Hz). In addition, a fiber optic sample holder allows studying magnetization of a sample under the influence of a light source. The software measurement sequencer provides a set of high-level actions to enable you to write and control measurements automatically and in a way that suits your own specific requirements.
In TEM/Scanning TEM (STEM) high energy electrons incident on ultra-thin samples, allow imaging, diffraction, electron energy loss spectroscopy and chemical analysis of solid materials with a spatial resolution on the order of 1-2 Å. Samples must have a thickness of a few tens of nanometres and are prepared in sample preparation laboratory.
In SEM a beam is scanned over a sample surface while a signal from secondary or back-scattered electrons is recorded. SEM is used to image an area of the sample with nanometric resolution, and also to measure its composition, crystallographic phase distribution and local texture.
XPS is a surface spectroscopic technique for quantitative measurements of the elemental composition or stoichiometry and the chemical state of the present elements, like their oxidation state and chemical bonds. XPS is highly surface sensitive, giving chemical and binding energy information from the a narrow region close to the surface.
XRD provides non-destructive information on the structural order of a material. At large scattering angles XRD permits to identify different crystal phases and to quantify lattice distances and crystalline volume fractions. At low angles of incidence the surface roughness of a single crystal and the thickness of a deposition layer can be obtained.
We offer magneto-transport characterizations of semiconductor and metallic samples at temperatures down to liquid He and fields up to 7T. Density and mobility of carriers are measured through Hall effect, as well as quantum transport phenomena in 2D systems at low T. Carrier populations can be tuned by bias voltages and external illumination.