X-ray/soft-X-ray spectroscopy

IXS Inelastic X-ray Scattering
Inelastic X-ray Scattering (IXS) permits to analyze several aspects of materials' dynamics. It includes X-Ray Raman Scattering to measure soft x-ray atomic absorption edges with a bulk sensitivity, Resonant Inelastic X-Ray Scattering to probe magnetic and orbital excitations in strongly correlated electron systems, and Compton scatterring.
DiProi-FEL Coherent Diffraction Imaging @ Free Electron Laser
DiProI end-station is a multi-porpose experimental chamber dedicated to time resolved imaging and scattering experiments taking advantage of FEL radiation provided by the FERMI source. The instrument is particular appealing for provide ultrafast information on electronic and spin dynamics after an external stimolus.
IOS In-operando spectroscopy
Soft X-rays XAS operating at Ambient Pressure allows for in-operando spectroscopic investigation of surfaces and their catalytical properties. This opens interesting access to L and M-edges of most of the transition metals and K-edges of light elements (C, O and N). The high surface sensitivity is achieved by the total electron yield detection.
XAS X-ray Absorption Spectroscopy
XAS is sensitive to the local bonding environment of the atom absorbing the X-rays, providing information on oxidation states, local orbital symmetry, molecular orientation and chemically selective density of states. It is widely used in molecular and condensed matter physics, material science, engineering, chemistry, earth science and biology.
XMCD/XMLD X-ray Magnetic Circular/Linear Dichroism
When X-ray absorption is measured with circularly/linearly polarized x-rays, spin and angular momenta can be determined in ferromagnetic/antiferromagnetic systems, respectively. Dichroic effects arise by the difference between spectra measured with different helicity/polarization orientation of the X-ray photons.
SXES Soft x-ray Spectroscopy with Electrons
Electron-beam induced soft X-ray emission spectroscopy (SXES) is a non destructive technique for the analysis of chemical bonding of materials on a micron spatial scale. The SXES spectrometer is mounted on an electron microprobe (EPMA) instrument and covers the photon energy range 50 eV- 210 eV.