Auger Electron Spectroscopy (AES) and SAM are electron beam techniques allowing the analysis of the surface elemental composition of materials. By pointing or scanning the electron beam, localized information or spatial elemental distributions can be obtained. Auger depth profiling allows measuring elemental concentration profiles.

Photoemission microscopy combines XPS with high spatial resolution, achieved by a small spot X-ray beam or by a magnifying electron optical column. Surface-sensitive images are provided for investigating processes occurring at morphologically/chemically complex solid surfaces including chemical reactions and mass transport processes.

The Spectroscopic PhotoEmission and Low Energy Electron Microscope (SPELEEM) installed at the MAXPEEM beamline offers unique possibilities for extracting simultaneously elemental, chemical, magnetic and electronic information at spatial resolutions down to the single digit nanometer range to users from a wide area of research fields.

Hyperspectral imaging is an advanced hybrid technique that incorporates simultaneously two techniques, imaging and spectroscopy. It finds applications on the characterization of materials with spatial variability like painted surfaces, or materials that have suffered stresses which alter their chemical composition.

Multispectral imaging is a hybrid technique that allows the simultaneous acquisition of both images and reflection spectra. It is very useful to characterize materials with spatial variability like painted surfaces, or materials that have suffered stresses which alter their chemical composition.