spectroscopic photoemission and low energy electron microscope

Electronic & Chemical & Magnetic Characterization (Spectro-microscopy)

SPELEEM microscope is being used by a broad range of researchers from different scientific areas such as materials science, nano-science and technology, physics, chemistry, and biophysics. Here are the main imaging modes of the SPELEEM microscope:

- X-ray Photoemission Electron Microscopy (XPEEM). Energy filtered imaging (elemental/chemical mapping).
- X-ray Magnetic Circular (Linear) Dichroism (XMCD, XMLD). Imaging of magnetic domains in ferromagnets (XMCD) and in antiferromagnets (XMLD) on the nm scale.
- Micro-X-ray Photoemission Spectroscopy (micro-XPS). Photoelectron spectroscopy
from extremely small areas down to a fraction of a micron.

- Micro-X-ray Absorption Spectroscopy (XAS). Imaging of secondary electron emission at fixed kinetic energy as a function of the photon energy.

- PhotoElectronDiffraction( PED). The intensity of a core level line as a function of energy
and emission angle is measured. The technique can provide spatially resolved
information on the surface crystallographic structure and is therefore complementary to
LEED and STM. If the valence band electrons form a diffraction pattern, the band- and
Fermi surface mapping in the full cone becomes possible (micro-ARPES).
- Low Energy Electron Microscopy (LEEM). Study of morphology of crystalline surfaces. Several contrast mechanisms (including Dark Field Imaging) allow the determination of the lateral dimensions of regions with a given crystal structure, the thickness distribution of thin overlayers with monolayer resolution, the imaging of monoatomic surface steps and other morphological features)
- Micro-Low Energy Electron Diffraction (micro-LEED). The diffraction patterns can be collected from areas as small as 100nm.

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