Mercury Probe Electrical Testing

Nano to Micro/Macro (Electrical analysis)

The mercury probe is a precision instrument that facilitates rapid, convenient, and non-destructive characterization of semiconductor samples. Such probe can contact a semiconductor wafer with mercury to form a dot and a ring contact of well-defined area. The mercury probe may be used with oxidized semiconductor wafers as a gate to form a metal/oxide/semiconductor test structure for rapid insulator characterization (Capacitance vs Voltage or Capacitance vs Frequency), or it may used to form a Schottky barrier directly on a semiconductor for resistivity measurements. The mercury probe eliminates time-consuming metallization previously required for these measurements. The mercury probe may be used in a number of novel measurement configurations because of its mercury ring contact. The ring contact may act as the substrate contact for measurements of samples on semi-insulating substrates, and for oxidized samples without need for backside preparation. The mercury probe can be used with any semiconductor or insulator that does not react with mercury

          provided at NFFA-Europe laboratories by: