UHV reflection-absorption IR spectroscopy

Electronic & Chemical & Magnetic Characterization (Optical spectroscopy)

(UHV-RAIRS) ultrahigh vacuum reflection-absorption infrared spectroscopy permits vibrational spectroscopic studies at grazing incidence on adsorbed molecules on well-defined solid surfaces.

In UHV-RAIRS, the optical path is entirely evacuated to avoid background signals from gas phase species and results in a superior sensitivity and stability of the system. Essential prerequisites for monitoring molecular species adsorbed, e.g., on oxide single-crystal surfaces are wide pressure (UHV to ambient conditions) and temperature ranges (1000-100 K).

provided at NFFA-Europe laboratories by:

CSIC-ICMM

Spain

DESY + PETRA III

Germany

FORTH

Greece

TUG

Italy

EURONANOLAB

France

provided at Large Scale Facilities by:

ALBA

Spain

DESY + PETRA III

Germany

Ultra-high vacuum-reflection absorption IR spectroscopy (UHV-RAIRS) @ DESY NanoLab

Applications

Vibrational spectroscopic study at grazing incidence on well-defined solid surfaces. The unique feature of the IR apparatus is the entirely evacuated optical path to avoid background signals from gas phase species

Source

Bruker, VERTEX 80v

Source Energy Range

~ 900 cm-1 - 5 cm-1

Detection

External MCT detector for RAIRS measurements on well-ordered solid surfaces Internal DTG detector for Fourier-transform IR spectroscopy (FTIRS) on powder surfaces

Overall Energy Resolution

Spectral resolution: 0.2 cm-1

Sample

In-situ measurements at variable pressure range: 10-10 mbar < P < 1 bar In-situ measurements at variable temperature range: 110 K to 1000 K (liquid N2 cooling)

Environment

10-10- 10-11 mbar base pressure

Ancillary Techniques

Gas dosing system permitting in-situ experiments

Additional Tools

Direct sample transfer under UHV from and to the UHV system

CSIC-ICMM

Spain

Stardust: INFRA-ICE module: RAIRS

Applications

Reflection Absorption Infra-Red Spectroscopy (mid- and near IR) under ultra-high vacuum conditions and at low temperatures (T=15-300K). Complete evacuated optical path to avoid background signals from gas phase species.

Source

Bruker, VERTEX 70V spectrometer. Mid-IR: standard globar and a water-cooled high-power source. Near-IR: tungsten halogen lamp.

Source Energy Range

12800 cm^-1 - 850 cm^-1

Detection

For mid-IR: DLaTGS and MCT detectors. For near-IR: InGaAs detector.

Overall Energy Resolution

Maximum resolution: 0.16 cm^−1

Sample

Maximum dimensions: 15 x 15 mm^2. For low temperature experiments: 10 x 10 x 1 mm^2. Substrate needs to be IR reflective (e.g., Au, Al, Cu...).

Environment

Base pressure: 4 x 10^-10 mbar. Temperature control: 15 - 300 K. Gases up to 10^-6 mbar can be introduced in the sample chamber.

Ancillary Techniques

UV irradiation (Ly-alpha line: 121.6 nm). Electron irradiation (1-500 meV). Ion irradiation (0.2 - 6 keV).

Additional Tools

Quadrupole mass spectrometry (1 - 200 amu) for Thermal Programmed Desorption experiments (T = 15 - 300 K).

Detection Energy Range

12800 cm^-1 - 850 cm^-1

Interactive Remote Access

Remote Control

EURONANOLAB

France

IRS at EURONANOLAB - IEMN

EURONANOLAB

France

IRS at EURONANOLAB - LAAS

EURONANOLAB

France

IRS at EURONANOLAB - IMT