Magnetometry

Electronic & Chemical & Magnetic Characterization (Magnetic characterisation)

The facility provides an automated MagLab-EXA multi-measurement system for all your nanomaterials characterization needs that allows a user to assess his/her material’s potential in exploitable nanotechnology. A modular set of analytical probes (AC/DC magnetometry, magneto-transport, Hall effect etc) is made available to identify technologically useful quantum mechanical phenomena for designing materials (e.g. semiconductors, metals, magnetic oxides) with optimal device operational capabilities, such as in magnetic storage technology, spin electronics, quantum computing etc.

MagLab-EXA is a state-of-art facility that probes cooperative microscopic mechanisms (e.g. magnetic/electric dipole order, electronic transport) in nanomaterials governed by multiple length and time scales.

MagLab-EXA provides the user with a high specification, low-temperature (1.8-320 K), high magnetic field (0-7 Tesla), modular sample environment for a wide variety of physical property measurements by using different probes and materials

in different nanoscale morphologies, from films to nanocrystals.

A non-exhaustive list of possible routine measurements as a function of temperature and applied magnetic field, involves: AC susceptibility (0.01-10 kHz), DC moment extraction, Resistivity and Hall effect, van derPauw measurements, dielectric permittivity (up to 2 MHz) and DC polarization. Importantly, the software measurement sequencer provides a set of high level actions to enable you to write and control measurement sequences that suit your own specific requirements, therefore facilitating custom-designed experiments of interest to the user.

provided at NFFA-Europe laboratories by:

CSIC-ICMAB

Spain

FORTH

Greece

EURONANOLAB

France

INESC-MN

Portugal

Instruments datasheets

EURONANOLAB

France

Magnetometry at EURONANOLAB - PoliFAB

CSIC-ICMAB

Spain

Quantum Design PPMS System

Detection

Standard and VSM

provided at NFFA-Europe laboratories by:

CSIC-ICMAB

Spain

FORTH

Greece

EURONANOLAB

France

INESC-MN

Portugal

Also consider

Structural & Morphology Characterization

SEM Scanning Electron Microscopy

In SEM a beam is scanned over a sample surface while a signal from secondary or back-scattered electrons is recorded. SEM is used to image an area of the sample with nanometric resolution, and also to measure its composition, crystallographic phase distribution and local texture.

Structural & Morphology Characterization

XRD X-Ray Diffraction

XRD provides non-destructive information on the structural order of a material. At large scattering angles XRD permits to identify different crystal phases and to quantify lattice distances and crystalline volume fractions. At low angles of incidence the surface roughness of a single crystal and the thickness of a deposition layer can be obtained.

Nano to Micro/Macro

LSIVP Laser surface and in-volume Patterning

Laser patterning is a technique for the controlled patterning of materials at micro- and nano-scales. It offers the ability to directly write patterns on the surface and complex 3D channels into the bulk of solid materials, also biomaterials. Applications can range from microfluidic systems and sensors to tissue engineering scaffolds.

Theory & Simulation

MMMEI Multiscale modeling of materials under extreme irradiation

This techniques offers a multi-scale theoretical framework that allows for the estimation of structural and phase changes when materials are exposed to extreme irradiation conditions generated by various types of electromagnetic sources (e.g. synchrotron sources, pulsed and free-electron lasers).