CARAC is the annual event dedicated to advanced characterization techniques for the electronics domain and related fields. The 2025 edition, organised by IRT Nanoelec, features contributions from major European partners, including the European Synchrotron Radiation Facility (ESRF), Institut Laue-Langevin (ILL), CEA-Leti (PFNC), CNRS-LPSC, Néel Institute, CMTC, and SERMA Technologies.

This year’s edition marks a special milestone — 10 years of the Platform for Advanced Characterisation Grenoble (PAC-G), a decade of connecting research and industry around advanced characterization and reliability in microelectronics.

Characterization plays a crucial role in ensuring the design, reliability, and performance of new electronic components. As the “More-than-Moore” approach drives the evolution of semiconductor technologies, the need for cutting-edge characterization techniques has never been greater. CARAC 2025 provides a platform for discussing current industry challenges and exploring state-of-the-art, non-destructive physical and chemical methods that reveal the structural, chemical, and functional properties of materials at the micro- and nanoscale.

The event will feature expert-led sessions on key topics such as quantum and AI chips, power electronics, sustainable design, and 3D/heterogeneous integration. Participants will also gain insights into advanced tools including synchrotron X-rays, neutron imaging, and thin-film/interface analysis, and their applications in failure analysis, process reliability, and product qualification.

CARAC 2025 represents an excellent opportunity to strengthen collaboration between academia and industry, promoting innovation across the micro- and nanoelectronics sectors.

Date: 11 December 2025, 08:30–18:00

Venue: IBS Seminar Hall, EPN Campus, 71 avenue des Martyrs, 38000 Grenoble

Registration:

• Conference attendance: 6 October – 7 December 2025

• Facility visits: open until 15 November 202

For more information and registration, visit CARAC’s official website.