XRD
X-Ray Diffraction

Characterisation Installation 4
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XRD provides non-destructive information on the structural order of a material.

When the X-ray wavelength is of the order of the crystal lattice spacing, at large scattering angles XRD permits to identify different crystal phases in a sample and to quantify lattice distances and crystalline volume fractions.

At low angles of incidence, the X-rays are reflected at the surface or interface, and from the resulting X-ray reflectometry data the surface roughness of a single crystal and the thickness of a deposition layer can be obtained.

At an angle of incidence below the critical angle XRD is highly surface sensitive.

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          provided at NFFA-Europe laboratories by:
France
Italy
France
Spain
Greece
Spain
Spain
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          provided at Large Scale Facilities by:
Spain
Germany
Switzerland
France
ICN2
Spain

XRD

X-ray diffraction of nanopowder or thin film/multilayer materials. X-ray Reflectivity. Texture and Stress analysis. Epitaxial films. Grazing incidence. Non-ambient conditions.

Panalytical X’Pert Pro MPD and MPD diffractometers. Conventional Cu or Co tube. Thin film diffractometer is 4-angle goniometer with low/high resolution optics (2x and 4x Ge(220) crystal monochromators). 

PIXCel detector (2D solid state detector 256x256 pixels works as 1D detector). Ideal for fast reciprocal space mapping (typical 30 min-1h).

From a few mm2 up to 3” diameter flat samples.

DHS 1100 Anton Paar hot-stage (RT up to 1000°C), with controlled atmosphere (N2, O2 gas flows, fast gas mixing, wet/dry atmosphere). Compatible with all measurements XRD, texture, XRR, reciprocal space mapping.

Fast acquisition for phase transformation kinetics (single peak scan in 2-4 sec). High temperature chamber adapted for in-situ measurements with applied voltage/temperature/controlled atmosphere. In-plane diffraction geometry: ideal for exploring ultrathin films of a few nm.

PSI
Switzerland

XRD - MS Beamline @ Swiss Light Source Synchrotron

The Material Science (MS) beamline serves two endstations for surface diffraction and powder diffraction

Short-period (14 mm) in-vacuum, cryogenically cooled, permanent magnet undulator, flux at 10eV: 2.5x1013 ph/s/0.4 A, focused spot size 130µm x 40µm (1:1 focusing)

5 - 38 keV

PILATUS II novel photon-counting 2-D pixel detector, 486 x 195 pixels, each pixel subtending 0.0086o x 0.0086o, high SNR due to its zero electronic background noise, excellent point spread function; 2+3-circle surface diffractometer from Micro-Controle Newport

Horizontal or vertical sample positioning, hexapod for sample positioning and aligning

UHV, cryo-chamber

Choice of filters

Powder diffraction endstation is also available